Auger electrons analysis

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• Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …   Wikipedia

• Auger effect — The Auger effect (pronEng|ˈɔːʒɚ, or Oh jeh) is a phenomenon in physics in which the emission of an electron from an atom causes the emission of a second electron. [GoldBookRef|title=Auger effect|url=http://goldbook.iupac.org/A00520.html] When an… …   Wikipedia

• Auger electron spectroscopy — noun Date: 1970 an instrumental method for determining the chemical composition of a material s surface by means of analysis of the energies of Auger electrons emitted from the surface called also Auger spectroscopy …   New Collegiate Dictionary

• auger electron spectroscopy — noun Usage: usually capitalized A : an instrumental method for determining the chemical composition of a material s surface by means of analysis of the energies of Auger electrons emitted from the surface called also Auger spectroscopy …   Useful english dictionary

• analysis — /euh nal euh sis/, n., pl. analyses / seez /. 1. the separating of any material or abstract entity into its constituent elements (opposed to synthesis). 2. this process as a method of studying the nature of something or of determining its… …   Universalium

• surface analysis — ▪ chemistry Introduction       in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …   Universalium

• Microscope électronique à balayage — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

• Microscopie electronique a balayage — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

• Microscopie Électronique À Balayage — Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

• Microscopie électronique à balayage — Pour les articles homonymes, voir MEB, SEM, Microscope (homonymie) et Microscopie. Microscope électronique à balayage JEOL JSM 6340F La microscopie éle …   Wikipédia en Français

• Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français